Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]

• 資料種別: 図書
• ISBN: 0780393015
• タイトル: Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]
• 著者・編者: edited by Tung Chih-Hang ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapoer Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Anlaysis & Reliability (CICFAR), National University of Singapore
• 著者標目: International Symposium on the Physical & Failure Analysis of Integrated Circuits; https://ci.nii.ac.jp/author/DA1025375X; Tung, Chih-Hang; IEEE Reliability/CPMT/ED Singapore Chapter; IEEE Electron Devices Society; https://ci.nii.ac.jp/author/DA01257512; Centre for IC Failure Anlaysis & Reliability (CICFAR); National University of Singapore; https://ci.nii.ac.jp/author/DA06403305
• 出版事項: IEEE
• 出版年月日等: c2005
• 出版年（W3CDTF）: 2005
• 大きさ: 30 cm
• 並列タイトル等: 05TH8827
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Integrated circuits -- Defects -- Congresses; Integrated circuits -- Testing -- Congresses
• LCC: TK7874
• 対象利用者: 一般
• 一般注記: "IEEE Catalog Number 05TH8827"--T.p. verso; Includes bibliographical references and authors index
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA78343778#entity; https://lccn.loc.gov/2006276365
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA78343778 : BA78343778
• LC control number: 2006276365; https://lccn.loc.gov/2006276365