Nanometrology

• 資料種別: 電子資料
• タイトル: Nanometrology
• 著者・編者: produced by Society of Manufacturing Engineers ; producer/director/editor, David Rembiesa ; written by Tihamer T. Toth-Fejel
• 版: DVD-ROM
• 著者標目: Rembiesa, David; Toth-Fejel, Tihamer T.; Society of Manufacturing Engineers; https://ci.nii.ac.jp/author/DA0007772X
• 出版事項: Society of Manufacturing Engineers
• 出版年月日等: c2009
• 出版年（W3CDTF）: 2009
• 大きさ: 19 cm
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Nanostructured materials -- Measurement; Microscopy -- Measurement; Nonfiction films; DVD
• 対象利用者: 一般
• 一般注記: Summary: Learn detailed information on the two major types of microscopes in use today, which are based on either an energy beam made up of electrons or ions, or a scanning probe with a sharp tip. The energy beam methods may use electrons, such as in an S-E-M (scanning electron microscope), and the T-E-M (transmission electron microscope), or they may use ionized atoms, such as in the F-I-B (focused ion beam). The scanning probes include the S-T-M (scanning tunneling microscopy), and the A-F-M (atomic force microscopy)
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BB00811693#entity
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BB00811693 : BB00811693