著者・編者editors: William M. Mihalko ... [et al.]
一般注記Other editors: Jack E. Lemons, A. Seth Greenwald, Steven M. Kurtz
"ASTM stock #STP1606"--T.p.
"THIS COMPILATION OF Selected Technical Papers, STP1606, Beyond the Implant : Retrieval Analysis Methods for Implant Surveillance, contains peer-reviewed papers that were presented at a symposium held May 9, 2017, in Toronto, Ontario, Canada. The symposium was sponsored by ASTM International Committee F04 on Medical and Surginal Materials and Devices, and Subcommittee F04.22 on Arthroplasty."--Foreword
Includes bibliographical references
関連情報Selected technical papers
掲載誌Selected technical papers
連携機関・データベース国立情報学研究所 : CiNii Research
NACSIS書誌ID(NCID)https://ci.nii.ac.jp/ncid/BB27187435 : BB27187435