Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA pbk.

• 資料種別: 図書
• ISBN: 0819460249
• タイトル: Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA
• 巻次・部編番号: pbk.
• 著者・編者: Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
• 著者標目: Two- and three-dimensional methods for inspection and metrology; Harding, Kevin G.; https://ci.nii.ac.jp/author/DA08803133; Society of Photo-optical Instrumentation Engineers; https://ci.nii.ac.jp/author/DA00848546
• 出版事項: SPIE
• 出版年月日等: c2005
• 出版年（W3CDTF）: 2005
• 大きさ: 28 cm
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Computer vision -- Congresses; Imaging systems -- Congresses; Three-dimensional display systems -- Congresses; Quality control -- Optical methods -- Congresses; Optical measurements -- Congresses; Metrology -- Congresses
• LCC: TA1634
• 対象利用者: 一般
• 一般注記: Previous conference entitled: Two- and three-dimensional vision systems for inspection, control, and metrology; Includes bibliographical references and author index
• 関連情報: Proceedings; https://cir.nii.ac.jp/crid/1130282269217551104
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA85939927#entity; https://lccn.loc.gov/2006276029
• 掲載誌: Proceedings; https://cir.nii.ac.jp/crid/1130282269217551104
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA85939927 : BA85939927
• LC control number: 2006276029; https://lccn.loc.gov/2006276029