Low and high dielectric constant materials : materials science, processing, and reliability issues : proceedings of the fifth international symposium

• 資料種別: 図書
• ISBN: 1566772702
• タイトル: Low and high dielectric constant materials : materials science, processing, and reliability issues : proceedings of the fifth international symposium
• 著者・編者: editors, Mark J. Lododa, R. Singh, Simon S. Ang, Hazara S. Rathore ; [sponsord by] Dielectric Science and Technology, Electronics, and High Temperature Materials Divisions [of the Electrochemical Society]
• 著者標目: International Symposium on Low and High Dielectric Constant Materials; Lododa, Mark, J.; Singh, R.; Ang, Simon S.; Rathore, Hazara; Electrochemical Society. Dielectric Science and Technology Division; https://ci.nii.ac.jp/author/DA06421624
• 出版事項: Electrochemical Society
• 出版年月日等: c2000
• 出版年（W3CDTF）: 2000
• 大きさ: 23 cm
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Dielectric devices -- Congresses; Dielectrics -- Congresses
• LCC: TK7872.D53
• 対象利用者: 一般
• 一般注記: "... papers contributed from the presentations made during the 197th Meeting of the Electrochemical Society, Tronto, Ontario, Canada, May 2000. The Dielectric Science and Technology Division of the Electrochemical Society sponsored this symposium"--on "Preface"; Includes bibliographical references and indexes
• 関連情報: Proceedings; https://cir.nii.ac.jp/crid/1130282269273401728
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA54320814#entity; https://lccn.loc.gov/00111187
• 掲載誌: Proceedings; https://cir.nii.ac.jp/crid/1130282269273401728
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA54320814 : BA54320814
• LC control number: 00111187; https://lccn.loc.gov/00111187