Microscopy of semiconducting materials 1991 : proceedings of the Institute of Physics conference held at Oxford University, 25-28 March 1991

• 資料種別: 図書
• ISBN: 0854984062
• タイトル: Microscopy of semiconducting materials 1991 : proceedings of the Institute of Physics conference held at Oxford University, 25-28 March 1991
• 著者・編者: edited by A.G. Cullis and N.J. Long
• 著者標目: Cullis, A. G.; https://ci.nii.ac.jp/author/DA02050134; Long, N. J.; https://ci.nii.ac.jp/author/DA0670196X; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group; https://ci.nii.ac.jp/author/DA00418172; Royal Microscopical Society (Great Britain); https://ci.nii.ac.jp/author/DA02112581; Materials Research Society; https://ci.nii.ac.jp/author/DA00024949
• 出版事項: Institute of Physics
• 出版年月日等: c1991
• 出版年（W3CDTF）: 1991
• 大きさ: ill. ; 24 cm
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Semiconductors -- Congresses; Electron microscopy -- Congresses; Materials -- Microscopy -- Congresses; Epitaxy -- Congresses; Silicon crystals -- Congresses
• LCC: QC610.9
• 対象利用者: 一般
• 一般注記: Sponsored by the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society, and the Materials Research Society; Includes bibliographical references and indexes
• 関連情報: Institute of Physics conference series; https://cir.nii.ac.jp/crid/1130282269263611520
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA13491292#entity; https://lccn.loc.gov/91036083
• 掲載誌: Institute of Physics conference series; https://cir.nii.ac.jp/crid/1130282269263611520
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA13491292 : BA13491292
• LC control number: 91036083; https://lccn.loc.gov/91036083