Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] softbound

• 資料種別: 図書
• ISBN: 0780339851
• タイトル: Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore]
• 巻次・部編番号: softbound
• 著者・編者: edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Device Society ; in co-operation with National University of Singapore Centre for IC Failure Analysis & Reliability, Institute of Microelectronics,Singapore
• 著者標目: International Symposium on the Physical & Failure Analysis of Integrated Circuits; https://ci.nii.ac.jp/author/DA1025375X; Radhakrishnan, M. K.; https://ci.nii.ac.jp/author/DA10253771; Ho, Philip; Chim, Wai Kin; IEEE Singapore Section. Reliability/CPMT/EDA Chapter; https://ci.nii.ac.jp/author/DA10253782; IEEE Electron Devices Society; https://ci.nii.ac.jp/author/DA01257512; National University of Singapore. Centre for IC Failure Analysis and Reliability; https://ci.nii.ac.jp/author/DA10253793; Institute of Microelectronics,Singapore
• 出版事項: Institute of Electrical and Electronics Engineers
• 出版年月日等: c1997
• 出版年（W3CDTF）: 1997
• 大きさ: 30 cm
• 並列タイトル等: 6th International Symposium on the Physical & Failure Analysis of Integrated Circuites; 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits 1997; IPFA '97; 97TH8289
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Integrated circuits -- Defects -- Congresses; Integrated circuits -- Testing -- Congresses
• LCC: TK7874
• 対象利用者: 一般
• 一般注記: "IPFA '97 proceedings"--Cover; "IEEE catalog number 97TH8289"; Includes bibliographic references and author index
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA48398384#entity; https://lccn.loc.gov/97072002
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA48398384 : BA48398384
• LC control number: 97072002; https://lccn.loc.gov/97072002