2004 ROCS Workshop : proceedings : October 24, 2004, Monterey, California

• 資料種別: 図書
• ISBN: 0790801051
• タイトル: 2004 ROCS Workshop : proceedings : October 24, 2004, Monterey, California
• 著者・編者: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc
• 著者標目: ROCS Workshop; GaAs Reliability Workshop; JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards; IEEE Electron Devices Society; https://ci.nii.ac.jp/author/DA01257512
• 出版事項: JEDEC; IEEE
• 出版年月日等: [c2004]
• 出版年（W3CDTF）: 2004
• 大きさ: 28 cm
• 並列タイトル等: GaAs Reliability Workshop; ROCS Workshop - Reliability of Compound Semiconductors; 04TH8787
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Gallium arsenide semiconductors -- Congresses; Semiconductors -- Reliability -- Congresses; Semiconductors -- Materials -- Congresses
• LCC: TK7871.15.G3
• 対象利用者: 一般
• 一般注記: "IEEE Catalog Number: 04TH8787"--T.p. verso; "ROCS Workshop (formerly the GaAs REL Workshop)"--cover; Includes bibliographic references; "ROCS Workshop - Reliability of Compound Semiconductors Proceedings"--p. ii
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA77714273#entity; https://lccn.loc.gov/2005282512
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA77714273 : BA77714273
• LC control number: 2005282512; https://lccn.loc.gov/2005282512