2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California

• 資料種別: 図書
• ISBN: 079080106X
• タイトル: 2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California
• 著者・編者: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc
• 著者標目: ROCS Workshop; GaAs Reliability Workshop; JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards; IEEE Electron Devices Society; https://ci.nii.ac.jp/author/DA01257512
• 出版事項: JEDEC; IEEE
• 出版年月日等: [c2005]
• 出版年（W3CDTF）: 2005
• 大きさ: 28 cm
• 並列タイトル等: 05TH8858; GaAs Reliability Workshop; ROCS Workshop [Reliability of Compound Semiconductors]
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Gallium arsenide semiconductors -- Congresses; Semiconductors -- Reliability -- Congresses; Semiconductors -- Materials -- Congresses
• 対象利用者: 一般
• 一般注記: "IEEE Catalog Number: 05TH8858"--T.p. verso; "ROCS Workshop (formerly the GaAs REL Workshop)"--cover; "ROCS Workshop - Reliability of Compound Semiconductors Proceedings"--p. ii; Includes bibliographic references
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA78465775#entity
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA78465775 : BA78465775