Analytical techniques for the characterization of compound semiconductors : proceedings of symposium D on analytical techniques for the characterization of compound semiconductors of the 1990 E-MRS fall conference, Strasbourg, France, November 27-30, 1990

• 資料種別: 図書
• ISBN: 044489196X
• タイトル: Analytical techniques for the characterization of compound semiconductors : proceedings of symposium D on analytical techniques for the characterization of compound semiconductors of the 1990 E-MRS fall conference, Strasbourg, France, November 27-30, 1990
• 著者・編者: edited by G. Bastard and H. Oppolzer
• 著者標目: Bastard, Gerald; https://ci.nii.ac.jp/author/DA04528194; Oppolzer, Helmut; https://ci.nii.ac.jp/author/DA05311890; European Material Research Society (E-MRS) Symposium on "Analytical Techniques for the Characterization of Compound Semiconductors"; https://ci.nii.ac.jp/author/DA05920017
• 出版事項: North-Holland
• 出版年月日等: 1991
• 出版年（W3CDTF）: 1991
• 大きさ: 27 cm
• 出版地（国名コード）: ne
• 本文の言語コード: en
• 件名標目: Semiconductors -- Analysis -- Congresses; Semiconductors -- Optical properties -- Congresses
• LCC: QD139.S44
• 対象利用者: 一般
• 一般注記: "European Material Research Society (E-MRS) Symposium on "Analytical Techniques for the Charaterization of Compound Semiconductors" held in Strasbourg (France) from November 27-30, 1990."--Pref; Includes bibliographical references and indexes
• 関連情報: European Materials Research Society symposia proceedings; https://cir.nii.ac.jp/crid/1130282272475457408
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA1332142X#entity; https://lccn.loc.gov/91019416
• 掲載誌: European Materials Research Society symposia proceedings; https://cir.nii.ac.jp/crid/1130282272475457408
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA1332142X : BA1332142X
• LC control number: 91019416; https://lccn.loc.gov/91019416