Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

• 資料種別: 図書
• ISBN: 0818674660
• タイトル: Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore
• 著者・編者: edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council
• 著者標目: IEEE International Workshop on Memory Testing; https://ci.nii.ac.jp/author/DA09002934; Rajsuman, Rochit; https://ci.nii.ac.jp/author/DA06745397; Swee, Yong-Khim; https://ci.nii.ac.jp/author/DA11257100; Lau, Lee-Yee; https://ci.nii.ac.jp/author/DA11257111; IEEE Computer Society. Test Technology Technical Committee; https://ci.nii.ac.jp/author/DA03323957; IEEE Computer Society. Technical Committee on VLSI; https://ci.nii.ac.jp/author/DA04967445; IEEE Solid-State Circuits Council; https://ci.nii.ac.jp/author/DA02621632
• 出版事項: IEEE Computer Society Press
• 出版年月日等: c1996
• 出版年（W3CDTF）: 1996
• 大きさ: 28 cm
• 並列タイトル等: 96TB100042
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Semiconductor storage devices -- Testing -- Congresses; Random access memory -- Congresses
• LCC: TK7895.M4
• 対象利用者: 一般
• 一般注記: "IEEE catalog number 96TB100042"--T.p. verso; Includes bibliographical references and index
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA35193367#entity
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA35193367 : BA35193367