Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

• 資料種別: 図書
• ISBN: 0769520049
• タイトル: Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California
• 著者・編者: sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]
• 著者標目: IEEE International Workshop on Memory Technology, Design, and Testing; https://ci.nii.ac.jp/author/DA12300318; Singh, Adit; Wik, Thomas; Rajsuman, Rochit; https://ci.nii.ac.jp/author/DA06745397; IEEE Computer Society; https://ci.nii.ac.jp/author/DA00479199; IEEE Computer Society. Test Technology Technical Council; https://ci.nii.ac.jp/author/DA1250352X; IEEE Computer Society. Technical Committee on VLSI; https://ci.nii.ac.jp/author/DA04967445; IEEE Solid-State Circuits Society; https://ci.nii.ac.jp/author/DA13128277
• 出版事項: IEEE Computer Society
• 出版年月日等: c2003
• 出版年（W3CDTF）: 2003
• 大きさ: 28 cm
• 並列タイトル等: PR02004; MTDT 2003; Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing
• 出版地（国名コード）: us
• 本文の言語コード: en
• 対象利用者: 一般
• 一般注記: "IEEE Computer Society Order Number PR02004" -- T. p. verso; Includes bibliographical references and index
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA65806250#entity
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA65806250 : BA65806250