Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts

• 資料種別: 図書
• ISBN: 0819429821
• タイトル: Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts
• 著者・編者: chairs/editors: Bruce G. Batchelor, John W.V. Miller, Susan Snell Soloman ; sponsored by SPIE - the International Society for Optical Engineering ; endorsed by MVA/SME - Machine Vision Association of the Society of Manufacturing Engineers
• 著者標目: Batchelor, Bruce G.; https://ci.nii.ac.jp/author/DA00400745; Miller, John W. V.; Solomon, Susan Snell; https://ci.nii.ac.jp/author/DA08887461; Society of Photo-optical Instrumentation Engineers; https://ci.nii.ac.jp/author/DA00848546; Machine Vision Association of SME; https://ci.nii.ac.jp/author/DA0187851X
• 出版事項: SPIE
• 出版年月日等: c1998
• 出版年（W3CDTF）: 1998
• 大きさ: 28 cm.
• 出版地（国名コード）: us
• 本文の言語コード: en
• 件名標目: Computer vision -- Congresses; Engineering inspection -- Automation -- Congresses; Optical measurements -- Congresses; Computer vision -- Industrial applications -- Congresses
• LCC: TA1634
• 対象利用者: 一般
• 一般注記: Includes bibliographical references and index
• 関連情報: Proceedings; https://cir.nii.ac.jp/crid/1130282269217551104
• 関連情報（URI）: https://ci.nii.ac.jp/ncid/BA50959622#entity
• 掲載誌: Proceedings; https://cir.nii.ac.jp/crid/1130282269217551104
• 連携機関・データベース: 国立情報学研究所 : CiNii Research
• 提供元機関・データベース: CiNii Books; https://ci.nii.ac.jp/books
• NACSIS書誌ID（NCID）: https://ci.nii.ac.jp/ncid/BA50959622 : BA50959622