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Bibliographic Record
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- Material Type
- 記事
- Author/Editor
- 西川 誠二岡田 亮太松浦 秀治
- Series Title
- Alternative Title
- Evaluation of Intrinsic Defects in Sacrificial Oxidized High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy
- Periodical title
- 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
- No. or year of volume/issue
- 111(357):2011.12.16
- Volume
- 111
- Issue
- 357