シリコン基板上GaNの高分解TEM観察

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Material Type: 記事
Title: シリコン基板上GaNの高分解TEM観察
Author/Editor: 澤木宣彦
岩田博之
川北将吾他
Author Heading: 澤木宣彦
岩田博之
川北将吾
Alternative Title: HR-TEM Analyses of GaN grown on silicon substrate
Periodical title: 愛知工業大学総合技術研究所研究報告 / 研究報告編集委員会編
No. or year of volume/issue: (14):2012.9
Issue: 14
Pages: 23-26
Publication date of volume/issue (W3CDTF): 2012-09
ISSN (Periodical Title): 1344-9672
ISSN-L (Periodical Title): 1344-9672
Publication (Periodical Title): 豊田 : 愛知工業大学総合技術研究所
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM2
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z74-B826
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024017698
http://id.ndl.go.jp/bib/024017698
Bibliographic Record Category (NDL): 632