Investigation of the Low-Frequency Noise Behavior and Its Correlation with the Subgap Density of States and Bias-Induced Instabilities in Amorphous InGaZnO Thin-Film Transistors with Various Oxygen Flow Rates

Investigation of the Low-Frequency Noise Behavior and Its Correlation with the Subgap Density of States and Bias-Induced Instabilities in Amorphous InGaZnO Thin-Film Transistors with Various Oxygen Flow Rates

Call No. (NDL): Z53-A375
Bibliographic ID of National Diet Library: 024025832

Material type: 記事

Author: Chan-Yong Jeongほか

Publisher: Tokyo : The Japan Society of Applied Physics

Publication date: 2012-10

Material Format: Paper

Journal name: Japanese journal of applied physics : JJAP 51(10)(1):2012.10

Publication Page: p.100206-1-3

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Paper

Material Type: 記事
Title: Investigation of the Low-Frequency Noise Behavior and Its Correlation with the Subgap Density of States and Bias-Induced Instabilities in Amorphous InGaZnO Thin-Film Transistors with Various Oxygen Flow Rates
Author/Editor: Chan-Yong Jeong
Ick-Joon Park
In-Tak Cho 他
Author Heading: Chan-Yong Jeong
Ick-Joon Park
In-Tak Cho
Periodical title: Japanese journal of applied physics : JJAP
No. or year of volume/issue: 51(10)(1):2012.10
Volume: 51
Issue: 10
Sequential issue number: 1
Pages: 100206-1-3
Publication date of volume/issue (W3CDTF): 2012-10
ISSN (Periodical Title): 0021-4922
ISSN-L (Periodical Title): 0021-4922
Publication (Periodical Title): Tokyo : The Japan Society of Applied Physics
Place of Publication (Country Code): JP
Text Language Code: eng
NDLC: ZM35
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z53-A375
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024025832
http://id.ndl.go.jp/bib/024025832
Bibliographic Record Category (NDL): 632