Volume number69(1・2)=217:2012
散乱X線の理論強度を...

散乱X線の理論強度を用いるSnめっき中Pbの蛍光X線分析 : EDXによるRoHS指令元素の蛍光X線分析

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散乱X線の理論強度を用いるSnめっき中Pbの蛍光X線分析 : EDXによるRoHS指令元素の蛍光X線分析

Call No. (NDL)
Z16-472
Bibliographic ID of National Diet Library
024032498
Material type
記事
Author
小川 理絵ほか
Publisher
京都 : 島津評論編集部 ; 1940-
Publication date
2012
Material Format
Paper
Journal name
島津評論 / 島津評論編集部 [編] 69(1・2)=217:2012
Publication Page
p.181-188
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Paper

Material Type
記事
Author/Editor
小川 理絵
越智 寛友
市丸 直人 他
Alternative Title
X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays : Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)
Periodical title
島津評論 / 島津評論編集部 [編]
No. or year of volume/issue
69(1・2)=217:2012
Volume
69
Issue
1・2
Sequential issue number
217