多品種小量生産履歴デ...

多品種小量生産履歴データに基づく半導体ウェハ加工プロセス予測制御モデルの構築手法 : MCMC法による統計的予測モデル構築のエンジニアリングサービス実現 (特集 サービス工学)

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多品種小量生産履歴データに基づく半導体ウェハ加工プロセス予測制御モデルの構築手法 : MCMC法による統計的予測モデル構築のエンジニアリングサービス実現(特集 サービス工学)

Call No. (NDL)
Z4-298
Bibliographic ID of National Diet Library
024039665
Material type
記事
Author
玉置 研二ほか
Publisher
東京 : 日本経営工学会
Publication date
2012-10
Material Format
Paper
Journal name
日本経営工学会論文誌 = Journal of Japan Industrial Management Association 63(3):2012.10
Publication Page
p.182-195
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Paper Digital

Material Type
記事
Author/Editor
玉置 研二
金子 俊一
Alternative Title
Method to Build a Predictive Control Model for a Semiconductor Wafer Process Based on Historical Data of Many Products in Small Quantities : Statistical Predictive Model for Engineering Service Using MCMC Method
Periodical title
日本経営工学会論文誌 = Journal of Japan Industrial Management Association
No. or year of volume/issue
63(3):2012.10
Volume
63
Issue
3