表面・薄膜物理学原子テクノロジーの源流(第12章)RHEED励起X線全反射角分光法の開発と応用(1)新しい高感度表面元素分析法

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Material Type: 記事
Title: 表面・薄膜物理学原子テクノロジーの源流(第12章)RHEED励起X線全反射角分光法の開発と応用(1)新しい高感度表面元素分析法
Author/Editor: 井野正三
Author Heading: 井野正三
Periodical title: 金属
No. or year of volume/issue: 83(2)=1117:2013.2
Volume: 83
Issue: 2
Sequential issue number: 1117
Pages: 155-164
Publication date of volume/issue (W3CDTF): 2013-02
ISSN (Periodical Title): 0368-6337
ISSN-L (Periodical Title): 0368-6337
Publication (Periodical Title): 東京 : アグネ技術センター
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZP41
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z17-289
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024249530
http://id.ndl.go.jp/bib/024249530
Bibliographic Record Category (NDL): 632