微摺動機構による電気...

微摺動機構による電気接点の劣化現象 : 時系列変動データの解析(27) (機構デバイス)

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微摺動機構による電気接点の劣化現象 : 時系列変動データの解析(27)

(機構デバイス)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
024261688
Material type
記事
Author
和田 真一ほか
Publisher
東京 : 電子情報通信学会
Publication date
2013-01-25
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 112(415):2013.1.25
Publication Page
p.9-14
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Paper

Material Type
記事
Author/Editor
和田 真一
越田 圭治
永井 祥子 他
Series Title
Alternative Title
Degradation Phenomenon of Electrical Contacts by using Micro-Sliding Mechanisms : Analysis of Time-Sequential Fluctuation Data (27)
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
112(415):2013.1.25
Volume
112
Issue
415