FETの寄生素子を考慮した伝送線路帰還FET発振回路のQファクタシミュレーションとSSB雑音測定 (マイクロ波)

FETの寄生素子を考慮した伝送線路帰還FET発振回路のQファクタシミュレーションとSSB雑音測定

(マイクロ波)

Journal name: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 112(381):2013.1.17・18

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Material Type: 記事
Title: FETの寄生素子を考慮した伝送線路帰還FET発振回路のQファクタシミュレーションとSSB雑音測定
Author/Editor: 南昂孝
崎原孫周
ウリントヤ他
Series Title: マイクロ波
Author Heading: 南昂孝
崎原孫周
ウリントヤ
Alternative Title: Q Factor Simulation and SSB Noise Measurement for Transmission Line Feedback FET Oscillators with FET Parasitic Elements
Periodical title: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue: 112(381):2013.1.17・18
Volume: 112
Issue: 381
Pages: 11-16
Publication date of volume/issue (W3CDTF): 2013-01
ISSN (Periodical Title): 0913-5685
ISSN-L (Periodical Title): 0913-5685
Publication (Periodical Title): 東京 : 電子情報通信学会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: 発振回路
SSB雑音
Qファクタ
伝送線路
FET
寄生素子
スタブ
oscillator
SSB noise
Q-factor
transmission line
parasitic element
stub
NDLC: ZN33
Target Audience: 一般
Report No. (Article): MW2012-144
Holding library: 国立国会図書館
Call No.: Z16-940
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024263541
http://id.ndl.go.jp/bib/024263541
Bibliographic Record Category (NDL): 632