TM plane wave reflection and transmission from a thin film with one-dimensional disorder : Enhanced scattering (エレクトロニクスシミュレーション)

TM plane wave reflection and transmission from a thin film with one-dimensional disorder : Enhanced scattering

(エレクトロニクスシミュレーション)

Journal name: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 112(401):2013.1.24・25

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Material Type: 記事
Title: TM plane wave reflection and transmission from a thin film with one-dimensional disorder : Enhanced scattering
Author/Editor: Yasuhiko Tamura
Series Title: エレクトロニクスシミュレーション
Author Heading: Yasuhiko Tamura
Periodical title: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue: 112(401):2013.1.24・25
Volume: 112
Issue: 401
Pages: 169-174
Publication date of volume/issue (W3CDTF): 2013-01
ISSN (Periodical Title): 0913-5685
ISSN-L (Periodical Title): 0913-5685
Publication (Periodical Title): 東京 : 電子情報通信学会
Place of Publication (Country Code): JP
Text Language Code: eng
Subject Heading: 1D random medium
thin film
TM incidence
reflection and transmission
enhanced scattering
stochastic functional approach
NDLC: ZN33
Target Audience: 一般
Report No. (Article): EMT-13-31
Holding library: 国立国会図書館
Call No.: Z16-940
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024266378
http://id.ndl.go.jp/bib/024266378
Bibliographic Record Category (NDL): 632