Bibliographic Record
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- Material Type
- 記事
- Author/Editor
- 池田 浩也鈴木 悠平三輪 一聡 他
- Series Title
- Alternative Title
- Variation of Seebeck coefficient of Si-on-insulator layer induced by bias-injected carriers
- Periodical title
- 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
- No. or year of volume/issue
- 112(446):2013.2.27・28
- Volume
- 112
- Issue
- 446