Two-stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability (IPSJ Transactions on System LSI Design Methodology Vol.1)
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- Material Type
- 記事
- Title
- Author/Editor
- KENTARO KATOHKAZUTERU NAMBAHIDEO ITO
- Author Heading
- Periodical title
- 情報処理学会論文誌 論文誌トランザクション
- No. or year of volume/issue
- 2008年度(1) 2008.11
- Volume
- 2008年度
- Issue
- 1
- Pages
- 91-103