原子分解能収差補正STEMと低加速への発展 (特集 収差補正による原子分解能電子顕微鏡の最前線)
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- Material Type
- 記事
- Author/Editor
- 沢田 英敬佐々木 健夫奥西 栄治 他
- Series Title
- Alternative Title
- Aberration Corrected STEM in Atomic Resolution and Resolution Enhancement in Low-Voltage Microscope
- Periodical title
- 表面科学 = Journal of the Surface Science Society of Japan / 日本表面科学会 編
- No. or year of volume/issue
- 34(5):2013.5
- Volume
- 34
- Issue
- 5