SIMS proceedings paper : Time-of-flight SIMS depth profiling of Na in SiO₂ glass using C₆₀ sputter ion beam
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- Material Type
- 記事
- Author/Editor
- Daisuke KobayashiYuichi YamamotoTsuguhide Isemura
- Author Heading
- Periodical title
- Research report of Asahi Glass Co., Ltd. = 旭硝子研究報告
- No. or year of volume/issue
- 63:2013
- Volume
- 63
- Pages
- 33-36
- Publication date of volume/issue (W3CDTF)
- 2013
- ISSN (Periodical Title)
- 0004-4210