最新表面科学講座(第16講)二次イオン質量分析法 : TOF-SIMSの紹介

Journal name: 色材協会誌 = Journal of the Japan Society of Colour Material 86(10):2013.10

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Material Type: 記事
Title: 最新表面科学講座(第16講)二次イオン質量分析法 : TOF-SIMSの紹介
Author/Editor: 石川修司
竹口裕子
Author Heading: 石川修司
竹口裕子
Alternative Title: Secondary Ion Mass Spectrometry : Time of Flight Secondary Ion Mass Spectrometry
Periodical title: 色材協会誌 = Journal of the Japan Society of Colour Material
No. or year of volume/issue: 86(10):2013.10
Volume: 86
Issue: 10
Pages: 386-391
Publication date of volume/issue (W3CDTF): 2013-10
ISSN (Periodical Title): 0010-180X
ISSN-L (Periodical Title): 0010-180X
Publication (Periodical Title): 東京 : 色材協会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: 飛行時間型二次イオン質量分析
液体金属イオン銃
ガスクラスタイオンビーム
TOF-SIMS
Liquid metal ion gun
Gas cluster ion beam
NDLC: ZP23
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z17-211
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024945184
http://id.ndl.go.jp/bib/024945184
Bibliographic Record Category (NDL): 632