グラフェン冷陰極からの電子放出特性の透過型電子顕微鏡その場測定 (電子デバイス)

グラフェン冷陰極からの電子放出特性の透過型電子顕微鏡その場測定

(電子デバイス)

Journal name: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 113(257):2013.10.22・23

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Material Type: 記事
Title: グラフェン冷陰極からの電子放出特性の透過型電子顕微鏡その場測定
Author/Editor: 村上勝久
吉田木の実
藤田淳一
Series Title: 電子デバイス
Author Heading: 村上勝久
吉田木の実
藤田淳一
Alternative Title: In-situ transmission-electron microscopy measurement of field emission properties of graphene emitters
Periodical title: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue: 113(257):2013.10.22・23
Volume: 113
Issue: 257
Pages: 9-12
Publication date of volume/issue (W3CDTF): 2013-10
ISSN (Periodical Title): 0913-5685
ISSN-L (Periodical Title): 0913-5685
Publication (Periodical Title): 東京 : 電子情報通信学会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: グラフェン
電界電子放出
graphene
field emission
NDLC: ZN33
Target Audience: 一般
Report No. (Article): ED2013-52
Holding library: 国立国会図書館
Call No.: Z16-940
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 025003255
http://id.ndl.go.jp/bib/025003255
Bibliographic Record Category (NDL): 632