SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent Lines (Special Section on VLSI Design and CAD Algorithms)
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- Material Type
- 記事
- Title
- Author/Editor
- Jun YAMASHITAHiroyuki YOTSUYANAGIMasaki HASHIZUME 他
- Author Heading
- Periodical title
- IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
- No. or year of volume/issue
- E96-A(12)=504:2013.12
- Volume
- E96-A
- Issue
- 12
- Sequential issue number
- 504