微摺動機構による電気...

微摺動機構による電気接点の劣化現象 : 接触抵抗変動のモデリング(5) (非線形問題)

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微摺動機構による電気接点の劣化現象 : 接触抵抗変動のモデリング(5)

(非線形問題)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
025403472
Material type
記事
Author
和田 真一ほか
Publisher
東京 : 電子情報通信学会
Publication date
2014-03
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 113(486):2014.3.10・11
Publication Page
p.67-72
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Paper

Material Type
記事
Author/Editor
和田 真一
越田 圭治
久保田 洋彰 他
Series Title
Alternative Title
Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism : Modeling about Fluctuation of Contact Resistance(5)
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
113(486):2014.3.10・11
Volume
113
Issue
486