Volume number2012
ESPIに基づく2枚...

ESPIに基づく2枚のスペックルパターンのみを用いた高分解能面外変形計測法

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ESPIに基づく2枚のスペックルパターンのみを用いた高分解能面外変形計測法

Call No. (NDL)
Z74-F452
Bibliographic ID of National Diet Library
025620233
Material type
記事
Author
新井 泰彦ほか
Publisher
東京 : 日本光学測定機工業会
Publication date
2012
Material Format
Paper
Journal name
光計測シンポジウム論文集 2012
Publication Page
p.57-60
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Paper

Material Type
記事
Author/Editor
新井 泰彦
横関 俊介
Periodical title
光計測シンポジウム論文集
No. or year of volume/issue
2012
Pages
57-60
Publication date of volume/issue (W3CDTF)
2012
Publication (Periodical Title)
東京 : 日本光学測定機工業会
Place of Publication (Country Code)
JP