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Bibliographic Record
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- Material Type
- 記事
- Author/Editor
- 山下 良之吉川 英樹知京 豊裕 他
- Series Title
- Alternative Title
- Bias-Dependence Potential Distribution in Gate Stack Structures by Hard-X-ray Photoelectron Spectroscopy under Device Operation
- Periodical title
- 表面科学 = Journal of the Surface Science Society of Japan / 日本表面科学会 編
- No. or year of volume/issue
- 35(7):2014.7
- Volume
- 35
- Issue
- 7