誤差要因と測定精度の向上 : 2枚のスペックルパターンのみを用いたスペックル干渉計測法

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Material Type: 記事
Title: 誤差要因と測定精度の向上 : 2枚のスペックルパターンのみを用いたスペックル干渉計測法
Author/Editor: 新井泰彦
Author Heading: 新井泰彦
Periodical title: 機械の研究 = Science of machine
No. or year of volume/issue: 67(4):2015.4
Volume: 67
Issue: 4
Pages: 297-306
Publication date of volume/issue (W3CDTF): 2015-04
ISSN (Periodical Title): 0368-5713
ISSN-L (Periodical Title): 0368-5713
Publication (Periodical Title): 東京 : 養賢堂
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZN11
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z16-395
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 026277895
http://id.ndl.go.jp/bib/026277895
Bibliographic Record Category (NDL): 632