X線干渉計を用いたZeffイメージング法の開発

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Material Type: 記事
Title: X線干渉計を用いたZeffイメージング法の開発
Author/Editor: 米山明男
馬場理香
竹谷敏他
Author Heading: 米山明男
馬場理香
竹谷敏
Alternative Title: Development of Zeff Imaging Using X-ray Interferometer
Periodical title: 顕微鏡 = Microscopy / 「顕微鏡」編集委員会編
No. or year of volume/issue: 50(1):2015
Volume: 50
Issue: 1
Pages: 67-70
Publication date of volume/issue (W3CDTF): 2015
ISSN (Periodical Title): 1349-0958
ISSN-L (Periodical Title): 1349-0958
Publication (Periodical Title): 東京 : 日本顕微鏡学会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: X線干渉計
実効原子番号
位相イメージング
吸収イメージング
Zeffイメージング
NDLC: ZN33
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z16-896
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 026555265
http://id.ndl.go.jp/bib/026555265
Bibliographic Record Category (NDL): 632