X線光電子分光法によるSiO₂/β-Ga₂O₃界面のバンドアライメント評価 (電子デバイス)

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X線光電子分光法によるSiO₂/β-Ga₂O₃界面のバンドアライメント評価

(電子デバイス)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
026678846
Material type
記事
Author
小西 敬太ほか
Publisher
東京 : 電子情報通信学会
Publication date
2015-07
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 115(156):2015.7.24・25
Publication Page
p.21-24
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Paper

Material Type
記事
Author/Editor
小西 敬太
上村 崇史
ワン マンホイ 他
Series Title
Alternative Title
Band alignment at SiO₂/β-Ga₂O₃ interface determined by x-ray photoelectron spectroscopy
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
115(156):2015.7.24・25
Volume
115
Issue
156