Moire Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales (Special Issue on Laser Metrology for Precision Measurement and Inspection in Industry)
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- Material Type
- 記事
- Author/Editor
- Qinghua WangHiroshi TsudaSatoshi Kishimoto 他
- Author Heading
- Periodical title
- International journal of automation technology
- No. or year of volume/issue
- 9(5)=49:2015.9
- Volume
- 9
- Issue
- 5
- Sequential issue number
- 49