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Moire Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales (Special Issue on Laser Metrology for Precision Measurement and Inspection in Industry)

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Moire Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales(Special Issue on Laser Metrology for Precision Measurement and Inspection in Industry)

Call No. (NDL)
Z78-A598
Bibliographic ID of National Diet Library
026733424
Material type
記事
Author
Qinghua Wangほか
Publisher
Tokyo : Fuji Technology Press
Publication date
2015-09
Material Format
Paper
Journal name
International journal of automation technology 9(5)=49:2015.9
Publication Page
p.494-501
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Paper Digital

Material Type
記事
Author/Editor
Qinghua Wang
Hiroshi Tsuda
Satoshi Kishimoto 他
Periodical title
International journal of automation technology
No. or year of volume/issue
9(5)=49:2015.9
Volume
9
Issue
5
Sequential issue number
49