組込みソフトウェア開発における設計関連メトリクスに基づく下流試験欠陥数の予測
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- Material Type
- 記事
- Author/Editor
- 角田 雅照門田 暁人松本 健一
- Alternative Title
- Predicting Faults After Unit Testing Using Design Phase Metrics in Embedded Software Development
- Periodical title
- SEC journal / 情報処理推進機構技術本部ソフトウェア・エンジニアリング・センター 編
- No. or year of volume/issue
- 11(2)=45:2015.9
- Volume
- 11
- Issue
- 2
- Sequential issue number
- 45