走査型プローブ顕微鏡によるサファイア基板上窒化ガリウム層の表面形状及び表面電位観測

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走査型プローブ顕微鏡によるサファイア基板上窒化ガリウム層の表面形状及び表面電位観測

Call No. (NDL)
Z16-B380
Bibliographic ID of National Diet Library
027297172
Material type
記事
Author
潤間 威史ほか
Publisher
東京 : 電気学会
Publication date
2016-04
Material Format
Paper
Journal name
電気学会論文誌. E, センサ・マイクロマシン部門誌 = IEEJ transactions on sensors and micromachines 136(4):2016.4
Publication Page
p.96-101
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Paper Digital

Material Type
記事
Author/Editor
潤間 威史
佐藤 宣夫
石川 博康
Alternative Title
Surface Potential and Topography Measurements of Gallium Nitride on Sapphire by Scanning Probe Microscopy
Periodical title
電気学会論文誌. E, センサ・マイクロマシン部門誌 = IEEJ transactions on sensors and micromachines
No. or year of volume/issue
136(4):2016.4
Volume
136
Issue
4
Pages
96-101