意図的な電磁妨害時に...

意図的な電磁妨害時にハードウェアトロイより引き起こされる情報漏えい評価に関する基礎検討 (電磁環境研究会 EMC一般)

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意図的な電磁妨害時にハードウェアトロイより引き起こされる情報漏えい評価に関する基礎検討

(電磁環境研究会 EMC一般)

Call No. (NDL)
Z74-C92
Bibliographic ID of National Diet Library
027537942
Material type
記事
Author
衣川 昌宏ほか
Publisher
東京 : 電気学会
Publication date
2016-03-22
Material Format
Paper
Journal name
電気学会研究会資料. EMC = The papers of technical meeting on electromagnetic compatibility, IEE Japan 2016(9-15):2016.3.22
Publication Page
p.21-24
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Paper

Material Type
記事
Author/Editor
衣川 昌宏
林 優一
森 達哉
Alternative Title
Fundamental Study on Evaluation of EM information Leakage caused by IEMI with Hardware Trojan
Periodical title
電気学会研究会資料. EMC = The papers of technical meeting on electromagnetic compatibility, IEE Japan
No. or year of volume/issue
2016(9-15):2016.3.22
Volume
2016
Issue
9-15