走査透過電子顕微鏡を...

走査透過電子顕微鏡を用いた電子線回折法による局所構造解析

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走査透過電子顕微鏡を用いた電子線回折法による局所構造解析

Call No. (NDL)
Z14-1454
Bibliographic ID of National Diet Library
027755731
Material type
記事
Author
尾﨑 友厚ほか
Publisher
和泉 : 大阪府立産業技術総合研究所
Publication date
2016-09
Material Format
Paper
Journal name
研究所報告 / 大阪府立産業技術総合研究所 編 (30):2016.9
Publication Page
p.33-36
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Paper

Material Type
記事
Author/Editor
尾﨑 友厚
長谷川 泰則
Alternative Title
Local Crystal Structure Analysis by Electron Diffraction Method Using Scanning Transmission Electron Microscopy
Periodical title
研究所報告 / 大阪府立産業技術総合研究所 編
No. or year of volume/issue
(30):2016.9
Issue
30
Pages
33-36
Publication date of volume/issue (W3CDTF)
2016-09