意図的な電磁妨害時にハードウェアトロイによって引き起こされる情報漏えい評価
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CiNii Research
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- Material Type
- 記事
- Author/Editor
- 衣川 昌宏林 優一森 達哉
- Alternative Title
- Evaluation of EM Information Leakage caused by IEMI with Hardware Trojan
- Periodical title
- 電気学会論文誌. A, 基礎・材料・共通部門誌 = IEEJ transactions on fundamentals and materials
- No. or year of volume/issue
- 137(3):2017.3
- Volume
- 137
- Issue
- 3
- Pages
- 153-157