Transmission SIMS Imaging Using a Secondary Electron Microscope

Journal name: Annual report of Quantum Science and Engineering Center 19:2016.4-2017.3

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Material Type: 記事
Title: Transmission SIMS Imaging Using a Secondary Electron Microscope
Author/Editor: K. Yamamoto
H. Ishii
J. Sawada
K. Nakajima
K. Kimura
Author Heading: K. Yamamoto
H. Ishii
J. Sawada
K. Nakajima
K. Kimura
Periodical title: Annual report of Quantum Science and Engineering Center
No. or year of volume/issue: 19:2016.4-2017.3
Volume: 19
Pages: 53-55
Publication date of volume/issue (W3CDTF): 2016
ISSN (Periodical Title): 1345-0700
ISSN-L (Periodical Title): 1345-0700
Publication (Periodical Title): Uji : Quantum Science and Engineering Center
Place of Publication (Country Code): JP
Text Language Code: eng
NDLC: ZN36
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z63-C795
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028525137
http://id.ndl.go.jp/bib/028525137
Bibliographic Record Category (NDL): 632