雑誌電子情報通信学会技術研究報告 : 信学技報
Volume number117巻313号 2017年11月17日
ArticleMIS-CELIV法...

MIS-CELIV法による有機半導体薄膜の正孔移動度評価 (有機エレクトロニクス)

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MIS-CELIV法による有機半導体薄膜の正孔移動度評価

(有機エレクトロニクス)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
028699407
Material type
記事
Author
片桐 千帆ほか
Publisher
東京 : 電子情報通信学会
Publication date
2017-11-17
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 117(313):2017.11.17
Publication Page
p.7-10
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Paper

Material Type
記事
Title
MIS-CELIV法による有機半導体薄膜の正孔移動度評価
Author/Editor
片桐 千帆
中山 健一
Series Title
有機エレクトロニクス
Author Heading
片桐 千帆
中山 健一
Alternative Title
Hole mobility measurement in organic semiconductor thin films by MIS-CELIV method
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
117(313):2017.11.17
Volume
117
Issue
313