高温域で安定な高ゲー...

高温域で安定な高ゲージ率を示すCr-Al-N薄膜ひずみセンサ (特集 第34回「センサ・マイクロマシンと応用システム」シンポジウム受賞論文)

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高温域で安定な高ゲージ率を示すCr-Al-N薄膜ひずみセンサ(特集 第34回「センサ・マイクロマシンと応用システム」シンポジウム受賞論文)

Call No. (NDL)
Z16-B380
Bibliographic ID of National Diet Library
029122985
Material type
記事
Author
丹羽 英二
Publisher
東京 : 電気学会
Publication date
2018-07
Material Format
Paper
Journal name
電気学会論文誌. E, センサ・マイクロマシン部門誌 = IEEJ transactions on sensors and micromachines 138(7):2018.7
Publication Page
p.294-300
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Paper Digital

Material Type
記事
Author/Editor
丹羽 英二
Author Heading
Alternative Title
Stable High Gauge Factor of Cr-Al-N Thin Film Strain Sensor in High Temperature Range
Periodical title
電気学会論文誌. E, センサ・マイクロマシン部門誌 = IEEJ transactions on sensors and micromachines
No. or year of volume/issue
138(7):2018.7
Volume
138
Issue
7