Compensation of Temperature Induced Flipping-Bits in CMOS SRAM PUF by NMOS Body-Bias

• Material Type: 記事
• Title: Compensation of Temperature Induced Flipping-Bits in CMOS SRAM PUF by NMOS Body-Bias
• Author/Editor: Xuanhao ZHANG; Xiang CHEN; Hanfeng SUN; Hirofumi SHINOHARA
• Series Title: 技術と社会・倫理
• Author Heading: Xuanhao ZHANG; Xiang CHEN; Hanfeng SUN; Hirofumi SHINOHARA
• Periodical title: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
• No. or year of volume/issue: 118(152):2018.7.25・26
• Volume: 118
• Issue: 152
• Pages: 333-336
• Publication date of volume/issue (W3CDTF): 2018-07
• ISSN (Periodical Title): 0913-5685
• ISSN-L (Periodical Title): 0913-5685
• Publication (Periodical Title): 東京 : 電子情報通信学会
• Place of Publication (Country Code): JP
• Text Language Code: eng
• Subject Heading: SRAM PUF; Flipping-Bits; Threshold Voltage; Body-Bias; Temperature
• NDLC: ZN33
• Target Audience: 一般
• Report No. (Article): SITE2018-33
• Holding library: 国立国会図書館
• Call No.: Z16-940
• Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 029143106; http://id.ndl.go.jp/bib/029143106
• Bibliographic Record Category (NDL): 632