Bibliographic Record
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- Material Type
- 記事
- Author/Editor
- 手嶋 俊彰矢野 佑典五百旗頭 健吾豊田 啓孝
- Series Title
- Alternative Title
- Study on Signal-to-Noise Ratio Simulation of Side-Channel Traces Leaked from AES Circuit using EDA tool
- Periodical title
- 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
- No. or year of volume/issue
- 118(272):2018.10.29
- Volume
- 118
- Issue
- 272