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Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 記事
- Author/Editor
- 相良 光彦和田 圭二西澤 伸一
- Series Title
- Alternative Title
- Experimental evaluation using repetitive UIS test for SiC power devices
- Periodical title
- 電気学会研究会資料. EDD = The papers of technical meeting on electron devices, IEE Japan / 電子デバイス研究会 [編]
- No. or year of volume/issue
- 2018(49-52・54-60):2018.11.1
- Volume
- 2018
- Issue
- 49-52・54-60