セラミックチップ部品のクラック解析技術 : 電位コントラスト法による微小クラックの検出

Journal name: 日本信頼性学会春季信頼性シンポジウム発表報文集 = Proceedings of Spring Symposium on Reliability 26:2018.6.4

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Paper
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 記事
Title: セラミックチップ部品のクラック解析技術 : 電位コントラスト法による微小クラックの検出
Author/Editor: 斎藤彰
Author Heading: 斎藤彰
Alternative Title: Failure Analysis Technique for Crack of Ceramic Chip Components : Detective Technique for Crack using Voltage Contrast SEM Image
Periodical title: 日本信頼性学会春季信頼性シンポジウム発表報文集 = Proceedings of Spring Symposium on Reliability
No. or year of volume/issue: 26:2018.6.4
Volume: 26
Pages: 39-42
Publication date of volume/issue (W3CDTF): 2018-06-04
Publication (Periodical Title): 東京 : 日本信頼性学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM1
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z74-J487
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 029506355
http://id.ndl.go.jp/bib/029506355
Bibliographic Record Category (NDL): 632