招待講演 MOSFETエージングモデルを用いた回路特性劣化SPICEシミュレーション (機構デバイス)

Icons representing 記事

招待講演 MOSFETエージングモデルを用いた回路特性劣化SPICEシミュレーション

(機構デバイス)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
029576287
Material type
記事
Author
田中 浩治ほか
Publisher
東京 : 電子情報通信学会
Publication date
2019-02-15
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 118(447):2019.2.15
Publication Page
p.25-30
View All

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

  • CiNii Research

    Search Service
    You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
記事
Author/Editor
田中 浩治
雨宮 真一郎
岡村 均
嶌末 政憲
Series Title
Alternative Title
SPICE based circuit performance degradation simulation with MOSFET aging models
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
118(447):2019.2.15
Volume
118
Issue
447