走査型透過電子顕微鏡法による陽イオン微小変位計測を用いた構造解析(特集原子変位を観る)

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Digital
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 記事
Title: 走査型透過電子顕微鏡法による陽イオン微小変位計測を用いた構造解析
Author/Editor: 小林俊介
山本剛久
幾原雄一
Series Title: 特集原子変位を観る
Author Heading: 小林俊介
山本剛久
幾原雄一
Alternative Title: Structural Analysis of Slight Cation Displacements Using Scanning Transmission Electron Microscopy
Periodical title: 顕微鏡 = Microscopy / 「顕微鏡」編集委員会編
No. or year of volume/issue: 54(1):2019
Volume: 54
Issue: 1
Pages: 19-23
Publication date of volume/issue (W3CDTF): 2019
ISSN (Periodical Title): 1349-0958
ISSN-L (Periodical Title): 1349-0958
Publication (Periodical Title): 東京 : 日本顕微鏡学会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: 走査型透過電子顕微鏡法
陽イオン変位
ピコメートル計測
結晶表面
強誘電体ドメイン
NDLC: ZN33
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z16-896
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 029752433
http://id.ndl.go.jp/bib/029752433
Bibliographic Record Category (NDL): 632